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| Data Sheet COMPLEMENTARY OUTPUT HALL EFFECT LATCH General Description The AH276 is an integrated Hall sensor with output driver designed for electronic commutation of brushless DC motor applications. The device includes an onchip Hall sensor for magnetic sensing, an amplifier that amplifies the Hall voltage, a Schmitt trigger to provide switching hysteresis for noise rejection, a temperature compensation circuit to compensate the temperature drift of Hall sensitivity and two complementary open-collector drivers for sinking large load current. It also includes an internal band-gap regulator which is used to provide bias voltage for internal circuits. Placing the device in a variable magnetic field, if the magnetic flux density is larger than threshold BOP, the pin DO will be turned low (on) and pin DOB will be turned high (off). This output state is held until the magnetic flux density reverses and falls below BRP, then causes DO to be turned high (off) and DOB turned low (on). AH276 is available in TO-94 (SIP-4L) package. AH276 Features * * * * * * * * On-Chip Hall Sensor 3.5V to 16V Supply Voltage 350mA (avg) Output Sink Current Reversed Supply Voltage Protection Build in Over Temperature Protection Function -20oC to 85oC Operating Temperature Low Profile TO-94 (SIP-4L) Package ESD Rating: 300V (Machine Model) Applications * * * * Dual-Coil Brushless DC Motor Dual-Coil Brushless DC Fan Revolution Counting Speed Measurement TO-94 Figure 1. Package Type of AH276 Apr. 2007 Rev. 1. 2 1 BCD Semiconductor Manufacturing Limited Data Sheet COMPLEMENTARY OUTPUT HALL EFFECT LATCH Pin Configuration Z4 Package (TO-94) AH276 4 3 2 1 GND DOB DO VCC Figure 2. Pin Configuration of AH276 (Front View) Pin Description Pin Number 1 2 3 4 Pin Name VCC DO DOB GND Supply voltage Output 1 Output 2 Ground Function Apr. 2007 Rev. 1. 2 2 BCD Semiconductor Manufacturing Limited Data Sheet COMPLEMENTARY OUTPUT HALL EFFECT LATCH Functional Block Diagram VCC 1 DO 2 AH276 Regulator Temperature Compensation 4 GND Hall Sensor Amplifier Schmitt Trigger Output Driver 3 DOB Over Temperature Protection Figure 3. Functional Block Diagram of AH276 Ordering Information AH276 Circuit Type Package Z4: TO-94 (SIP-4L) E1: Lead Free Magnetic Characteristics A: 10 to 50Gauss B: 5 to 70Gauss C: 100Gauss Package TO-94 Temperature Range oC Part Number AH276Z4-AE1 AH276Z4-BE1 AH276Z4-CE1 Marking ID AH276Z4-E1 AH276Z4-E1 AH276Z4-E1 Packing Type Bulk Bulk Bulk -20 to 85 BCD Semiconductor's Pb-free products, as designated with "E1" suffix in the part number, are RoHS compliant. Apr. 2007 Rev. 1. 2 3 BCD Semiconductor Manufacturing Limited Data Sheet COMPLEMENTARY OUTPUT HALL EFFECT LATCH Absolute Maximum Ratings (Note 1) (TA=25oC) Parameter Supply Voltage Reverse Protection Voltage Magnetic Flux Density Continuous Output Current Hold Peak (start up) Power Dissipation Die to atmosphere Thermal Resistance Die to package case Storage Temperature ESD (Machine Model) ESD (Human Body Model) PD JA JC TSTG IO Symbol VCC VRCC B Value 20 -20 Unlimited 350 550 750 550 227 49 -50 to 150 300 2500 Unit V V Gauss mA mA mA mW oC/W oC/W oC AH276 V V Note 1: Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "Recommended Operating Conditions" is not implied. "Absolute Maximum Ratings" for extended period may affect device reliability. Recommended Operating Conditions (TA=25oC) Parameter Supply Voltage Ambient Temperature Symbol VCC TA Min 3.5 -20 Max 16 85 Unit V o C Apr. 2007 Rev. 1. 2 4 BCD Semiconductor Manufacturing Limited Data Sheet COMPLEMENTARY OUTPUT HALL EFFECT LATCH Electrical Characteristics (TA=25oC, VCC=14V, unless otherwise specified) Parameter Output Saturation Voltage Output Leakage Current Supply Current Output Rise Time Output Fall Time Switch Time Differential Output Zener Breakdown Voltage Thermal Protection Temperature Thermal Protection Hysteresis Symbol VSAT IOL ICC tr tf t VZ TSD TSD Test Condition VCC=3.5V, IO=100mA IO=350mA VCE=16V VCC=16V, Output Open RL=820, CL=20pF RL=820, CL=20pF RL=820, CL=20pF Min Typ 0.3 0.35 0.1 12 3.0 0.3 3.0 55 178 40 0.6 10 16 10 1.5 10 Max Unit V V A mA s s s V o AH276 C oC Magnetic Characteristics (TA=25oC) Parameter Operating Point Symbol BOP Grade A B C A Releasing Point BRP B C Hysteresis BHYS V DO (V) Min 10 5 Typ Max 50 70 100 Unit Gauss Gauss Gauss Gauss Gauss Gauss -50 -70 -100 75 -10 -5 Gauss Off-state High Turn off B HYS Turn on V SAT On-state N B RP 0 B OP Low S Magnetic Flux Density (Gauss) Apr. 2007 Rev. 1. 2 5 BCD Semiconductor Manufacturing Limited Data Sheet COMPLEMENTARY OUTPUT HALL EFFECT LATCH Magnetic Characteristics (Continued) AH276 +14V AH276 VCC DO DOB GND S Marking Side 1 2 3 4 R1 820 R2 DO (VOUT1) DOB (VOUT2) C1 C2 N 820 20pF 20pF Figure 4. Basic Test Circuit DO (V) 16 DOB (V) 16 14 12 10 8 6 4 2 -20 0 20 40 VCC 14 12 10 8 6 4 2 VCC VSAT 20 40 VSAT -40 -40 -20 0 Magnetic Flux Density B (Gauss) Magnetic Flux Density B (Gauss) Figure 5. VDO vs. Magnetic Flux Density Figure 6. VDOB vs. Magnetic Flux Density Apr. 2007 Rev. 1. 2 6 BCD Semiconductor Manufacturing Limited Data Sheet COMPLEMENTARY OUTPUT HALL EFFECT LATCH Typical Performance Characteristics AH276 14 13 12 11 100 80 60 BOP/BRP/BHYS (Gauss) 40 20 0 -20 -40 -60 -80 ICC (mA) 10 9 8 7 6 5 2 4 6 8 10 12 14 16 18 20 BOP BRP BHYS Ta=25 C O Ta=-25 C O Ta=-0 C O Ta=+25 C O Ta=+85 C O 4 6 8 10 12 14 16 18 20 VCC (V) VCC (V) Figure 7. ICC vs. VCC Figure 8. BOP/BRP/BHYS vs. VCC 75 800 50 600 BOP/BRP/BHYS (Gauss) PD (mW) 25 400 0 -25 BOP BRP BHYS TA=+25 C O 200 -50 -20 0 20 40 60 80 0 -25 0 25 50 75 100 125 150 TA ( C) O TA ( C) o Figure 9. BOP/BRP/BHYS vs. Ambient Temperature Figure 10. PD vs. Ambient Temperature Apr. 2007 Rev. 1. 2 7 BCD Semiconductor Manufacturing Limited Data Sheet COMPLEMENTARY OUTPUT HALL EFFECT LATCH Typical Performance Characteristics (Continued) 6005 14 AH276 VCC=3.5V VCC=14V VCC=20V 500 12 400 IO=100mA IO=200mA IO=300mA IO=350mA IO=400mA 10 VSAT(mV) ICC (mA) 300 8 200 6 -20 0 20 O 100 -20 0 20 40 60 80 40 60 80 TA ( C) TA( C) O Figure 11. ICC vs. Ambient Temperature Figure 12. VSAT vs. Ambient Temperature Typical Applications D1 AH276 COIL1 VCC DO DOB GND COIL2 1 2 3 4 VCC + R1 470 C1 2.2F + R2 470 C2 2.2F Figure 12. Typical Application Circuit Apr. 2007 Rev. 1. 2 8 BCD Semiconductor Manufacturing Limited Data Sheet COMPLEMENTARY OUTPUT HALL EFFECT LATCH Mechanical Dimensions TO-94 Unit: mm(inch) AH276 0.500(0.020) 0.700(0.028) 1.520(0.059) 1.720(0.067) 3.780(0.149) 4.080(0.161) 45TYP 0.700(0.028) 0.900(0.035) 4.980(0.196) 5.280(0.208) 1.850(0.073) 0.360(0.014) 0.510(0.020) 1.250(0.050) 0.380(0.015) 0.550(0.022) 3.450(0.136) 3.750(0.148) Package Sensor Location 0.360(0.014) 0.500(0.020) 14.900(0.587) 15.300(0.602) 1.270(0.050) TYP 3.710(0.146) 3.910(0.154) Apr. 2007 Rev. 1. 2 9 BCD Semiconductor Manufacturing Limited http://www.bcdsemi.com IMPORTANT NOTICE BCD Semiconductor Manufacturing Limited reserves the right to make changes without further notice to any products or specifications herein. BCD Semiconductor Manufacturing Limited does not assume any responsibility for use of any its products for any particular purpose, nor does BCD Semiconductor Manufacturing Limited assume any liability arising out of the application or use of any its products or circuits. BCD Semiconductor Manufacturing Limited does not convey any license under its patent rights or other rights nor the rights of others. MAIN SITE BCD Semiconductor Manufacturing Limited - Wafer Fab Shanghai SIM-BCD Semiconductor Manufacturing Limited 800, Yi Shan Road, Shanghai 200233, China Tel: +86-21-6485 1491, Fax: +86-21-5450 0008 BCD Semiconductor Manufacturing Limited - IC Design Group Advanced Analog Circuits (Shanghai) Corporation 8F, Zone B, 900, Yi Shan Road, Shanghai 200233, China Tel: +86-21-6495 9539, Fax: +86-21-6485 9673 REGIONAL SALES OFFICE Shenzhen Office Shanghai SIM-BCD Semiconductor Manufacturing Co., Ltd. Shenzhen Office Advanced Analog Circuits (Shanghai) Corporation Shenzhen Office Room E, 5F, Noble Center, No.1006, 3rd Fuzhong Road, Futian District, Shenzhen 518026, China Tel: +86-755-8826 7951 Fax: +86-755-8826 7865 Taiwan Office BCD Semiconductor (Taiwan) Company Limited 4F, 298-1, Rui Guang Road, Nei-Hu District, Taipei, Taiwan Tel: +886-2-2656 2808 Fax: +886-2-2656 2806 USA Office BCD Semiconductor Corporation 30920 Huntwood Ave. Hayward, CA 94544, U.S.A Tel : +1-510-324-2988 Fax: +1-510-324-2788 |
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